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dc.contributor.author |
Belyaev, A.A. |
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Belyaev, A.E. |
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Konakova, R.V. |
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Vitusevich, S.A. |
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Milenin, V.V. |
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Soloviev, E.A. |
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Kravchenko, L.N. |
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Figielski, T. |
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Wosinski, T. |
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dc.contributor.author |
Makosa, A. |
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dc.date.accessioned |
2017-05-27T16:05:47Z |
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dc.date.available |
2017-05-27T16:05:47Z |
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dc.date.issued |
1999 |
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dc.identifier.citation |
Radiation hardness of AlAs/GaAs-based resonant tunneling diodes/ A.A. Belyaev, A.E. Belyaev, R.V. Konakova, S.A. Vitusevich, V.V. Milenin, E.A. Soloviev, L.N. Kravchenko, T. Figielski, T. Wosinski, A. Makosa// Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 1. — С. 98-101. — Бібліогр.: 19 назв. — англ. |
uk_UA |
dc.identifier.issn |
1560-8034 |
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dc.identifier.other |
PACS 73.61, 85.30.M |
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dc.identifier.uri |
http://dspace.nbuv.gov.ua/handle/123456789/117928 |
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dc.description.abstract |
The total dose effects of ⁶⁰Co γ-radiation on the electrical properties of double-barrier Resonant Tunneling Diodes have been studied. The devices manifest enhanced radiation hardness and conserve their operating parameters up to doses of 2×10⁹ rad. It is shown that all changes in the current-voltage characteristics stem from the effect of ionizing radiation on the undoped layers. The radiation-stimulated diffusion of the heteropair components in the contact region is shown to be important for the voltage drop distribution. |
uk_UA |
dc.description.sponsorship |
This work was supported by STCU under Grant No.464. |
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dc.language.iso |
en |
uk_UA |
dc.publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
uk_UA |
dc.relation.ispartof |
Semiconductor Physics Quantum Electronics & Optoelectronics |
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dc.title |
Radiation hardness of AlAs/GaAs-based resonant tunneling diodes |
uk_UA |
dc.type |
Article |
uk_UA |
dc.status |
published earlier |
uk_UA |
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