Показати простий запис статті
dc.contributor.author |
Litovchenko, P.G. |
|
dc.contributor.author |
Moss, R. |
|
dc.contributor.author |
Stecher-Rasmussen, F. |
|
dc.contributor.author |
Appelman, K. |
|
dc.contributor.author |
Barabash, L.I. |
|
dc.contributor.author |
Kibkalo, T.I. |
|
dc.contributor.author |
Lastovetsky, V.F. |
|
dc.contributor.author |
Litovchenko, A.P. |
|
dc.contributor.author |
Pinkovska, M.B. |
|
dc.date.accessioned |
2017-06-03T04:58:38Z |
|
dc.date.available |
2017-06-03T04:58:38Z |
|
dc.date.issued |
1999 |
|
dc.identifier.citation |
Semiconductor sensors for dosimetry of epithermal neutrons / P.G. Litovchenko, R. Moss, F. Stecher-Rasmussen, K. Appelman, L.I. Barabash, T.I. Kibkalo, V.F. Lastovetsky, A.P. Litovchenko, M.B. Pinkovska // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 2. — С. 90-91. — Бібліогр.: 4 назв. — англ. |
uk_UA |
dc.identifier.issn |
1560-8034 |
|
dc.identifier.other |
PACS 29.40.Wk |
|
dc.identifier.uri |
http://dspace.nbuv.gov.ua/handle/123456789/119067 |
|
dc.description.abstract |
Minimum energy of neutron to displace atoms in silicon crystals are equal to 200 eV. Due to this fact testing our p-i-n diodes under irradiation by the epithermal neutrons was carried out. The more advanced p-i-n diodes on the base of high purity silicon were used at present work, and, as a result, we have obtained considerably more sensitive sensors for more wide range of neutron doses. The sensitivity of sensors is 0.14 V/Gy for average neutron energy of 24 keV. |
uk_UA |
dc.language.iso |
en |
uk_UA |
dc.publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
uk_UA |
dc.relation.ispartof |
Semiconductor Physics Quantum Electronics & Optoelectronics |
|
dc.title |
Semiconductor sensors for dosimetry of epithermal neutrons |
uk_UA |
dc.type |
Article |
uk_UA |
dc.status |
published earlier |
uk_UA |
Файли у цій статті
Ця стаття з'являється у наступних колекціях
Показати простий запис статті