The resolution function and effective response of piezoelectric thin films in Piezoresponse Force Microscopy

dc.contributor.author	Morozovska, A.N.
dc.date.accessioned	2017-05-31T19:24:18Z
dc.date.available	2017-05-31T19:24:18Z
dc.date.issued	2008
dc.identifier.citation	The resolution function and effective response of piezoelectric thin films in Piezoresponse Force Microscopy / A.N. Morozovska // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 2. — С. 171-177. — Бібліогр.: 11 назв. — англ.	uk_UA
dc.identifier.issn	1560-8034
dc.identifier.other	PACS 77.80.Fm, 77.65.-j, 68.37.-d
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/118851
dc.description.abstract	The elastic Green function and resolution function in Piezoresponse Force Microscopy (PFM) of thin piezoelectric film capped on the rigid substrate are derived. The extrinsic size effect on the resolution function is demonstrated.	uk_UA
dc.description.sponsorship	Author is grateful to Academician, Prof. S.V. Svechnikov (NAS of Ukraine) and Dr. S.V. Kalinin (Oak Ridge National Laboratory) for valuable remarks.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України	uk_UA
dc.relation.ispartof	Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title	The resolution function and effective response of piezoelectric thin films in Piezoresponse Force Microscopy	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA