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періодичних видань НАН України
періодичних видань НАН України
Acoustic-emission method for controlling the defect-formation process in light-emitting structures
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- Фізико-технічні та математичні науки
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- Відділення фізики і астрономії
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- Semiconductor Physics Quantum Electronics & Optoelectronics
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- Semiconductor Physics Quantum Electronics & Optoelectronics, 2010, том 13
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- Semicond. Physics Quantum Electronics & Optoelectronics, 2010, № 3
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| dc.contributor.author | Lyashenko, O.V. | |
| dc.contributor.author | Vlasenko, A.I. | |
| dc.contributor.author | Veleschuk, V.P. | |
| dc.contributor.author | Kisseluk, M.P. | |
| dc.date.accessioned | 2017-05-30T06:54:41Z | |
| dc.date.available | 2017-05-30T06:54:41Z | |
| dc.date.issued | 2010 | |
| dc.identifier.citation | Acoustic-emission method for controlling the defect-formation process in light-emitting structures / O.V. Lyashenko, A.I. Vlasenko, V.P. Veleschuk, M.P. Kisseluk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 326-329. — Бібліогр.: 4 назв. — англ. | uk_UA |
| dc.identifier.issn | 1560-8034 | |
| dc.identifier.other | PACS 43.35.+d, 43.50.+y, 72.70.+m, 73.50.TD, 78.60.Fi, 78.66.Fd | |
| dc.identifier.uri | http://dspace.nbuv.gov.ua/handle/123456789/118399 | |
| dc.description.abstract | Сomplex researches of light-emitting structures based on А₃В₅ compounds have been carried out. It has been shown that at current loading exceeding the acousticemission threshold, there arises a change in the electroluminescence intensity, fluctuation of current and light. It has been ascertained that natural ageing leads to a general improvement of some practically important parameters of light-emitting structures, in particular to increase of maximal admissible currents and reliability. | uk_UA |
| dc.language.iso | en | uk_UA |
| dc.publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України | uk_UA |
| dc.relation.ispartof | Semiconductor Physics Quantum Electronics & Optoelectronics | |
| dc.title | Acoustic-emission method for controlling the defect-formation process in light-emitting structures | uk_UA |
| dc.type | Article | uk_UA |
| dc.status | published earlier | uk_UA |
