ЗМІСТ

Poroshin V.N., Gaydar A.V., Abramov A.A., Tulupenko V.N.
Stress-induced effects in light scattering by plasmons in p-type germanium

Talanin V.I., Talanin I.E.
Classification of microdefects in semiconducting silicon

Borkovska L.V., Bulakh B.M., Khomenkova L.Yu., Korsunska N.O., Markevich I.V.
Metastable interstitials in CdSe and CdS crystals

Glinchuk K.D., Litovchenko N.M., Strilchuk O.N.
On the origin of 300 K near-band-edge luminescence in CdTe

Opanasyuk A.S., Opanasyuk N.N., Tirkusova N.V.
High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films

Olikh O.Ya.
Acoustoelectric transient spectroscopy of microwave treated GaAs-based structures

Freik D.M., Boychuk V.I., Mezhylovsjka L.I.
Atomic defects and physical-chemical properties of PbTe-InTe solid solutions

Kovalyuk Z.D., Makhniy V.P., Yanchuk O.I.
Mechanisms of forward current transport in p-GaSe-n-InSe heterojunctions

Bochkova T.M., Plyaka S.N., Sokolyanskii G.Ch.
Unipolar injection currents in Bi₄Ge₃O₁₂ crystals

Manam J., Sharma S.K.
Thermally stimulated luminescence studies of undoped and doped CaB₄O₇ compounds

Kaganovich E.B., Kizyak I.M., Kirillova S.I., Konakova R.V., Lytvyn O.S., Lytvyn P.M., Manoilov E.G., Primachenko V.E., Prokopenko I.V.
Effect of microwave electromagnetic radiation on the structure, photoluminescence and electronic properties of nanocrystalline silicon films on silicon substrate

Fodchuk I.M., Gevyk V.B., Gimchinsky O.G., Kislovskii E.N., Kroytor O.P., Molodkin V.B., Olihovskii S.I., Pavelescu E.M., Pessa M.
Structural changes in multilayer systems containing In_xGa_1-xAs_1-yN_y quantum wells

Sachenko A.V., Kryuchenko Yu.V., Manoilov E.G., Kaganovich E.B.
A fresh approach to interpretation of visible photoluminescence spectra in silicon nanostructures

Makara V.A., Melnichenko M.M., Svezhentsova K.V., Khomenkova L.Yu., Shmyryeva O.M.
Structure and luminescence study of nanoporous silicon layers with high internal surface

Samah M., Bouguerra M., Khelfane H.
Optical properties of ZnO aggregates in KBr matrix

Kanevsky S.O., Litovchenko P.G., Opilat V.Ja., Tartachnyk V.P., Pinkovs'ka M.B., Shakhov O.P., Shapar V.M.
Study of gamma field induced degradation of green GaP light diode electroluminescence characteristics

Koshets I.A., Kazantseva Z.I., Shirshov Yu.M.
Polymer films as sensitive coatings for quartz crystal microbalance sensors array

Asghar M.H., Khan M.B., Naseem S.
Modeling high performance multilayer antireflection coatings for visible and infrared (3-5&#956m) substrates

Maslov V.P., Sarsembaeva A.Z., Sizov F.F.
Influence of elastic deformation on the residual ellipticity of polished optical materials

Borovytsky V.N.
Distortion compensation technique for high resolution microscopy

Popovych K., Nakonechny Yu., Rubish I., Gerasimov V., Leising G.
The study of the lifetime of ZnS-based luminescent films by using the devices of LMS series

Aw K.C., Ibrahim K.
Dual model describing effects of evaporated metal gate on low-k dielectric methylsilsesquioxane in metal oxide semiconductor capacitor structure

Kolomzarov Yu., Oleksenko P., Sorokin V., Tytarenko P., Zelinskyy R.
Vacuum method for creation of liquid crystal orienting microrelief