Dan’ko, V.A.; Bratus, V.Ya.; Indutnyi, I.Z.; Lisovskyy, I.P.; Zlobin, S.O.; Michailovska, K.V.; Shepeliavyi, P.E.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2010)
The effect of HF and H₂O₂ vapor treatment on the spectral composition and
intensity of photoluminescence (PL) in porous oblique deposited nc-Si–SiOx structures
have been studied using FTIR, electron-spin resonance (EPR) ...