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Method for replacing objects in 4F correlator: testing
Репозиторій DSpace/Manakin
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- Фізико-технічні та математичні науки
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- Відділення фізики і астрономії
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- Semiconductor Physics Quantum Electronics & Optoelectronics
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- Semiconductor Physics Quantum Electronics & Optoelectronics, 2005, том 8
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- Semicond. Physics Quantum Electronics & Optoelectronics, 2005, № 2
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Method for replacing objects in 4F correlator: testing
Інший ID:
PACS: 05.50. +q, 61.50.Em, 82.20.Fd
Посилання:
Method for replacing objects in 4F correlator: testing / P.V. Yezhov, A.V. Kuzmenko, Т.N. Smirnova, A. A. Ivanovskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 2. — С. 75-80. — Бібліогр.: 13 назв. — англ.
Дата:
2005
Переглядів:
661
Завантажень:
352
Анотація:
The method of pattern recognition based on replacement of object images incoming to the correlator by object-dependent synthesized phase objects calculated using the iterative Fourier-transform algorithm was developed by us earlier. In this work, we performed experimental testing the above method by using an optical-digital 4F-correlator. Synthesized phase objects were inputed into the correlator through the spatial light modulator LC2002. Holographic matched filters were recorded using self-developing photopolymers PPC-488. For two test objects, we obtained unified (δ-like) correlation signals with the signal-to-noise ratio reaching 24 dB, while the diffraction efficiency of these filters was up to 30%.
