Structural dependence of CsI(Tl) film scintillation properties

dc.contributor.author	Ananenko, A.
dc.contributor.author	Fedorov, A.
dc.contributor.author	Lebedinsky, A.
dc.contributor.author	Mateychenko, P.
dc.contributor.author	Tarasov, V.
dc.contributor.author	Vidaj, Yu.
dc.date.accessioned	2017-06-04T16:25:11Z
dc.date.available	2017-06-04T16:25:11Z
dc.date.issued	2004
dc.identifier.citation	Structural dependence of CsI(Tl) film scintillation properties / A. Ananenko, A. Fedorov, A. Lebedinsky, P. Mateychenko, V. Tarasov, Yu. Vidaj // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 297-300. — Бібліогр.: 5 назв. — англ.	uk_UA
dc.identifier.issn	1560-8034
dc.identifier.other	PACS: 68.55.Jk, 29.40.Mc
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/119128
dc.description.abstract	Scintillating CsI(Tl) films were obtained by vacuum deposition on single crystalline LiF substrates and non-orienting glass substrates. Their structure and morphology were examined by X-ray diffraction and scanning electron microscopy. Scintillation properties of films dependent on their structure are discussed.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України	uk_UA
dc.relation.ispartof	Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title	Structural dependence of CsI(Tl) film scintillation properties	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA