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Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate
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- Фізико-технічні та математичні науки
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- Відділення фізики і астрономії
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- Semiconductor Physics Quantum Electronics & Optoelectronics
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- Semiconductor Physics Quantum Electronics & Optoelectronics, 2012, том 15
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- Semicond. Physics Quantum Electronics & Optoelectronics, 2012, № 4
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Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate
Інший ID:
PACS 42.25.Ja, 73.21.-b, 78.67.Bf, 78.68.+m
Посилання:
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ.
Підтримка:
We are indebted to Thomas Senoy (University
Chemnitz, Germany) for the preparation of samples and
to Günter Hesser (ZONA, Johannes Kepler University
Linz, Austria) for the scanning electron microscopy of
the samples. We appreciate the visiting fellowship of the
Institute of Physics of the Academy of Sciences of the
Czech Republic. Partially this work was supported by
the program of the Ukrainian-Austrian cooperation,
grants M/432-2011 and M/231-2012 of the State agency
on sciences, innovations and informatization of Ukraine.
Дата:
2012
Переглядів:
694
Завантажень:
355
Анотація:
We have investigated optical properties of films of gold nanoparticles on
Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on
morphology of the films. Different morphology of the films was obtained by flashannealing
at various temperatures of identical sputtered thin gold layers. Ellipsometric
spectra were compared with account of pictures of the films obtained by scanned electron
microscopy. Remarkable dependence of depolarization of the reflected light with the
frequency of localized plasmon resonance versus the film morphology was found.
