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Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate
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- Відділення фізики і астрономії
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- Semiconductor Physics Quantum Electronics & Optoelectronics
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- Semiconductor Physics Quantum Electronics & Optoelectronics, 2012, том 15
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- Semicond. Physics Quantum Electronics & Optoelectronics, 2012, № 4
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| dc.contributor.author | Bortchagovsky, E.G. | |
| dc.contributor.author | Lozovski, V.Z. | |
| dc.contributor.author | Mishakova, T.O. | |
| dc.contributor.author | Hingerl, K. | |
| dc.date.accessioned | 2017-05-31T05:13:21Z | |
| dc.date.available | 2017-05-31T05:13:21Z | |
| dc.date.issued | 2012 | |
| dc.identifier.citation | Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ. | uk_UA |
| dc.identifier.issn | 1560-8034 | |
| dc.identifier.other | PACS 42.25.Ja, 73.21.-b, 78.67.Bf, 78.68.+m | |
| dc.identifier.uri | http://dspace.nbuv.gov.ua/handle/123456789/118718 | |
| dc.description.abstract | We have investigated optical properties of films of gold nanoparticles on Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on morphology of the films. Different morphology of the films was obtained by flashannealing at various temperatures of identical sputtered thin gold layers. Ellipsometric spectra were compared with account of pictures of the films obtained by scanned electron microscopy. Remarkable dependence of depolarization of the reflected light with the frequency of localized plasmon resonance versus the film morphology was found. | uk_UA |
| dc.description.sponsorship | We are indebted to Thomas Senoy (University Chemnitz, Germany) for the preparation of samples and to Günter Hesser (ZONA, Johannes Kepler University Linz, Austria) for the scanning electron microscopy of the samples. We appreciate the visiting fellowship of the Institute of Physics of the Academy of Sciences of the Czech Republic. Partially this work was supported by the program of the Ukrainian-Austrian cooperation, grants M/432-2011 and M/231-2012 of the State agency on sciences, innovations and informatization of Ukraine. | uk_UA |
| dc.language.iso | en | uk_UA |
| dc.publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України | uk_UA |
| dc.relation.ispartof | Semiconductor Physics Quantum Electronics & Optoelectronics | |
| dc.title | Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate | uk_UA |
| dc.type | Article | uk_UA |
| dc.status | published earlier | uk_UA |
