Анотація:
p-SiGe whisker samples with a diameter of ~40 μm, grown by chemical
precipitation from the vapor phase, have been investigated. Temperature dependences of
the thermal e.m.f. and conductivity within the temperature interval 20…400 K have been
measured. It has been shown that the mobility of holes in p - SiGe whiskers upon the
average is 1.5 times higher than that in bulk p - Si samples. p - SiGe whiskers possess
smaller phonon scattering and larger phonon dragging in comparison with the bulk
p - Si samples.