Анотація:
The drift of charge carriers in the p-Si₀.₈₈Ge₀.₁₂/Si heterostructures under strong
lateral electric fields and conditions of carrier generation by the band-to-band light
absorption has been investigated experimentally. The data of the drift length, drift
mobility, and lifetime of charge carriers within the temperature range 20 to 77 K under
the electric field up to 1500 V/cm are presented.