Перегляд за автором "Molodkin, V.B."

Результати 1-7 з 7

Complex diffractometrical investigation of structural and compositional irregularities in GaAs:Si/GaAs films heavily doped with silicon

Datsenko, L.I.; Klad’ko, V.P.; Lytvyn, P.M.; Domagala, J.; Machulin, V.F.; Prokopenko, I.V.; Molodkin, V.B.; Maksimenko, Z.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2001)

Complex of X-ray diffractometrical investigations, both angular and spectral dependences of a reflectivity for quasi-forbidden reflections, enable not only to discover structural microdefects and to measure their radii r ...
Double- and triple-crystal X-ray diffractometry of microdefects in silicon

Molodkin, V.B.; Olikhovskii, S.I.; Kyslovskyy, Ye.M.; Len, E.G.; Reshetnyk, O.V.; Vladimirova, T.P.; V.V. Lizunov, V.V.; Lizunova, S.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2010)

The generalized dynamical theory of X-ray scattering by real single crystals allows to self-consistently describe intensities of coherent and diffuse scattering measured by double- and triple-crystal diffractometers (DCD ...
Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals

Molodkin, V.B.; Olikhovskii, S.I.; Len, E.G.; Kyslovskyy, Ye.M.; Reshetnyk, O.V.; Vladimirova, T.P.; Sheludchenko, B.V.; Skakunova, E.S.; Lizunov, V.V.; Kochelab, E.V.; Fodchuk, I.M.; Klad’ko, V.P. (Металлофизика и новейшие технологии, 2016)

A short review of basic principles and limitations in obtaining the analytical expressions for the coherent and diffuse scattering intensities measured by the triple-crystal diffractometer (TCD) are presented. Explicit ...
Models of Deformation Dependences of Total Integrated Intensity of Dynamical Diffraction in Single Crystals for Various Diffraction Conditions

Brovchuk, S.M.; Molodkin, V.B.; Nizkova, A.I.; Rudnytska, I.I.; Grankina, G.L.; Lizunov, V.V.; Lizunova, S.V.; Sheludchenko, B.V.; Skakunova, E.S.; Dmitriev, S.V.; Zabolotnyi, I.N.; Katasonov, A.A.; Zhuravlev, B.F.; Lekhnyak, R.V.; Skapa, L.N.; Irha, N.P. (Металлофизика и новейшие технологии, 2014)

В работе с помощью теории Чуховского—Петрашеня для деформационной зависимости (ДЗ) интегральной интенсивности динамической дифракции (ИИДД) в кристаллах без дефектов показан характер изменения ДЗ ИИДД с толщиной кристаллов ...
Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of Strains and Defects in Ion-Implanted Garnet Films

Molodkin, V.B.; Olikhovskii, S.I.; Skakunova, E.S.; Len, E.G.; Kislovskii, E.N.; Reshetnyk, O.V.; Vladimirova, T.P.; Lizunov, V.V.; Skapa, L.N.; Lizunova, S.V.; Fuzik, E.V.; Tolmachev, N.G.; Ostafiychuk, B.K.; Pylypiv, V.M.; Garpul’, O.Z. (Металлофизика и новейшие технологии, 2015)

Numerical simulation of the reciprocal-space maps for ion-implanted single-crystal yttrium—iron garnet films on gadolinium—gallium garnet substrates is carried out and based on the theoretical model of the triple-axes ...
Structural changes in multilayer systems containing InxGa₁₋xAs₁₋yNy quantum wells

Fodchuk, I.M.; Gevyk, V.B.; Gimchinsky, O.G.; Kislovskii, E.N.; Kroytor, O.P.; Molodkin, V.B.; Olihovskii, S.I.; Pavelescu, E.M.; Pessa, M. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2003)

The investigations of multilayer nano-scale systems contained one or two quantum wells are carried out by double-crystal X-ray diffractometry. Processes of interdiffusion of In, Ga atoms and their influence on properties ...
Transformations of microdefect structure in silicon crystals under the influence of weak magnetic field

Vladimirova, T.P.; Kyslovs’kyy, Ye.M.; Molodkin, V.B.; Olikhovskii, S.I.; Koplak, O.V.; Kochelab, E.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2011)

Quantitative characterization of complex microdefect structures in annealed silicon crystals (1150 °С, 40 h) and their transformations after exposing for one day in a weak magnetic field (1 T) has been performed by ...

Результати 1-7 з 7

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