Modelling optical spectra and obtaining information on parameters and features of semiconductor structures

dc.contributor.author	Vasiljev, V.A.
dc.date.accessioned	2017-06-13T20:39:57Z
dc.date.available	2017-06-13T20:39:57Z
dc.date.issued	2002
dc.identifier.citation	Modelling optical spectra and obtaining information on parameters and features of semiconductor structures / V.A. Vasiljev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 3. — С. 288-293. — Бібліогр.: 13 назв. — англ.	uk_UA
dc.identifier.issn	1560-8034
dc.identifier.other	PACS: 78.30.-j
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/121299
dc.description.abstract	Problems of semiconductor optical spectrum identification are considered in the paper. Some models for description of optical reflection spectra in semiconductors and semiconductor structures are presented. Shown is the possibility to obtain information upon various parameters and characteristics of semiconductors and their structures by fitting theoretical spectra to experimental data. The estimation of validity and accuracy of obtained information is given.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України	uk_UA
dc.relation.ispartof	Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title	Modelling optical spectra and obtaining information on parameters and features of semiconductor structures	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA