High-power low-frequency current oscillations in germanium samples

dc.contributor.author	Pavljuk, S.P.
dc.date.accessioned	2017-05-27T10:00:05Z
dc.date.available	2017-05-27T10:00:05Z
dc.date.issued	2003
dc.identifier.citation	High-power low-frequency current oscillations in germanium samples / S.P. Pavljuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 1. — С. 19-22. — Бібліогр.: 3 назв. — англ.	uk_UA
dc.identifier.issn	1560-8034
dc.identifier.other	PACS: 72.20.-i
dc.identifier.other	PACS: 72.80.Cw
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/117868
dc.description.abstract	Experimental investigation of high-power low-frequency current oscillations in germanium samples with low injecting contacts is discussed in this article. The results obtained were explained by periodic formation, transport along the sample, and collapse of the thermal gradient-drift (TGD) domain. The domain formation mechanism is considered in details in [1].	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України	uk_UA
dc.relation.ispartof	Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title	High-power low-frequency current oscillations in germanium samples	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA