Перегляд за автором "Zubarev, E.N."

Сортувати за: Порядок: Результатів:

  • Malykhin, S.V.; Makhlai, V.A.; Surovitskiy, S.V.; Garkusha, I.E.; Herashchenko, S.S.; Kondratenko, V.V.; Kopylets, I.A.; Zubarev, E.N.; Borisova, S.S.; Fedchenko, A.V. (Вопросы атомной науки и техники, 2020)
    X-ray diffraction and SEM microscopy were used to study the structural and phase changes in a thin film obtained by magnetron sputtering of a Ti52Zr30Ni18 target (at.%) on a steel substrate under the radiation-thermal ...
  • Penkov, A.V.; Voronov, D.L.; Devizenko, A.Yu.; Ponomarenko, A.G.; Zubarev, E.N. (Functional Materials, 2005)
    X-ray photoelectron spectroscopy, transmission electron microscopy, and and low-angle X-ray diffraction were used to investigate the diffusion intermixing in multilayer periodic Mo/Si coatings during manufacturing and ...
  • Zhuravel, I.A.; Bugayev, Ye.A.; Penkov, A.V.; Zubarev, E.N.; Sevryukova, V.A.; Kondratenko, V.V. (Functional Materials, 2014)
    Formation of intermixing zones, their structure and phase composition in C/Si multilayers in as-deposited state and after annealing are studied. During deposition intermixing zones of ∼ 0.6 m thick are formed at both ...
  • Pershyn, Y.P.; Chumak, V.S.; Shypkova, I.G.; Mamon, V.V.; Devizenko, A.Yu.; Kondratenko, V.V.; Reshetnyak, M.V.; Zubarev, E.N. (Вопросы атомной науки и техники, 2018)
    WC/Si multilayer X-ray mirrors (MXMs) with nominal layers thicknesses of 0.2…30.3 nm (periods: 0.7…38.9 nm) were deposited by direct current magnetron sputtering and studied by X-ray diffraction and cross-sectional ...
  • Voronov, D.L.; Zubarev, E.N.; Kondratenko, V.V.; Pershun, Yu.P.; Sevryukova, V.A.; Bugayev, Ye.A. (Functional Materials, 2008)
    Kinetics of phase formation Sc/Si multilayers and Si/Sc/Si three-layers within the temperature range of 130-400°C has been studied by cross-sectional transmission electron microscopy and small-angle X-ray reflectometry. ...
  • Bugayev, Ye.A.; Devizenko, A.Yu.; Zubarev, E.N.; Kondratenko, V.V. (Functional Materials, 2007)
    The formation features of the Co/C multilayer with ≈2.3 nm period have been studied with aim to form a Schwarzschild objective on a "carbon window" for medical and biological investigations. A sequence of multilayer ...
  • Devizenko, A.Yu.; Kopylets, I.A.; Kondratenko, V.V.; Pershyn, Y.P.; Devizenko, I.Y.; Zubarev, E.N.; Savitskiy, B.A. (Functional Materials, 2018)
    The structure, construction and mechanical stresses of the TaSi₂/Si multilayer manufactured by magnetron sputtering on the heated substrates were studied in the initial state and after thermal annealing. Deposition of ...
  • Vus, A.S.; Savitsky, B.A.; Zubarev, E.N.; Moskalets, M.V. (Functional Materials, 2005)
    The structure of unsupported epitaxial films of С₆₀-Bi composite with hcp lattice has been studied after irradiation by 100 keV electron beam in the electron microscope column. А short-time irradiation of the film by ...
  • Bazdyreva, S.V.; Fedchuk, N.V.; Malykhin, S.V.; Pugachov, A.T.; Reshetnyak, M.V.; Zubarev, E.N. (Functional Materials, 2013)
    Method of quantitative estimates of the parameters of the icosahedral quasicrystals substructure, including specific phason defects, developed and successfully worked out using the experimental models of quasicrystalline ...
  • Guglya, A.G.; Marchenko, Yu.A.; Melnikova, E.S.; Vlasov, V.V.; Zubarev, E.N. (Вопросы атомной науки и техники, 2014)
    This scientific paper delves into the findings of the investigation carried out to determine the adsorption and electrophysical characteristics of nanoporous (V, 10 at.% Ti)Nx films obtained using the ion beam-assisted ...