Перегляд за автором "Rengevych, O.V."

Результати 1-4 з 4

A biosensor approach to probe the structure and function of the adsorbed proteins: fibrinogen at the gold surface

Snopok, B.A.; Kostyukevych, K.V.; Rengevych, O.V.; Shirshov, Yu.M.; Venger, E.F.; Kolesnikova, I.N.; Lugovskoi, E.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 1998)

The kinetics of adsorption and surface structure of adsorbed layers of the human fibrinogen on the gold surface, determined by Surface Plasmon Resonance (SPR) and Atomic Force Microscopy (AFM) analysis, was employed to ...
AFM study of micromorphology and microscopic growth mechanisms of Hg₁₋x CdxTe LPE epitaxial layers

Beketov, G.V.; Rashkovetskiy, L.V.; Rengevych, O.V.; Zhovnir, G.I. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2000)

Mercury cadmium telluride epitaxial layers exhibiting large areas with nearly atomically-flat surface were grown using liquid phase epitaxy (LPE) from Te-rich solution in closed system. Evolution of surface morphology ...
Separate determination of thickness and optical parameters by surface plasmon resonance: accuracy consideration

Rengevych, O.V.; Shirshov, Yu.M.; Ushenin, Yu.V; Beketov, A.G. (Semiconductor Physics Quantum Electronics & Optoelectronics, 1999)

Reliability and precision of characterization of surface layers by SPR method was evaluated with relation to the experimental conditions and the strategy of extracting the film parameters. Consideration is bound up with ...
Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy

Rengevych, O.V.; Beketov, G.V.; Ushenin, Yu.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2014)

The potential of surface plasmon resonance-enhanced total internal reflection microscopy for visualization of submicron particles has been demonstrated using submicron-sized silicon rods as a test object. Submicron Si-rods ...

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Перегляд за автором "Rengevych, O.V."

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Перегляд за автором "Rengevych, O.V."

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