Activation spectroscopy of electronically induced defects in solid Ne

dc.contributor.author	Grigorashchenko, O.N.
dc.contributor.author	Rudenkov, V.V.
dc.contributor.author	Khizhnyi, I.V.
dc.contributor.author	Savchenko, E.V.
dc.contributor.author	Frankowski, M.
dc.contributor.author	Smith-Gicklhorn, A.M.
dc.contributor.author	Beyer, M.K.
dc.contributor.author	Bondybey, V.E.
dc.date.accessioned	2018-01-14T13:23:56Z
dc.date.available	2018-01-14T13:23:56Z
dc.date.issued	2003
dc.identifier.citation	Activation spectroscopy of electronically induced defects in solid Ne / O.N. Grigorashchenko, V.V. Rudenkov, I.V. Khizhnyi, E.V. Savchenko, M. Frankowski, A.M. Smith-Gicklhorn, M.K. Beyer, V.E. Bondybey // Физика низких температур. — 2003. — Т. 29, № 9-10. — С. 1147-1151. — Бібліогр.: 20 назв. — англ.	uk_UA
dc.identifier.issn	0132-6414
dc.identifier.other	PACS: 78.60.Kn, 79.75.+g
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/128944
dc.description.abstract	Thermally stimulated luminescence (TSL) and thermally stimulated exoelectron emission (TSEE) methods were used in combination with cathodoluminescence to probe electronically induced defects in solid Ne. The defects were generated by a low energy electron beam. For spectroscopic study we used Ar* centers in Ne matrix as a model system. At a temperature of 10.5 K a sharp decrease in the intensity of "defect" components in the luminescence spectrum was observed. From the analysis of the corresponding peak in the TSL and TSEE yields the trap depth energy was estimated and compared with available theoretical calculations. The obtained data support the model suggested by Song, that stable electronically induced defects have the configuration of second-neighbour Frenkel pairs.	uk_UA
dc.description.sponsorship	We thank Profs. K.S. Song and G. Zimmerer for valuable discussions. Financial support from the Deutsche Forschungsgemeinschaft through the program «Förderung der wissenschaftlichen Beziehungen deutscher Wissenschaftler zu Wissenschaftlern in Ländern Mittel- und Osteuropas sowie Ländern der vormaligen UdSSR» is gratefully acknowledged.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України	uk_UA
dc.relation.ispartof	Физика низких температур
dc.subject	Spectroscopy in Cryocrystals and Matrices	uk_UA
dc.title	Activation spectroscopy of electronically induced defects in solid Ne	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA