New method for estimating the refractive index of optical materials in spectrally selective elements

Домашня сторінка
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Фізико-технічні та математичні науки
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Відділення фізики і астрономії
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Semiconductor Physics Quantum Electronics & Optoelectronics
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Semiconductor Physics Quantum Electronics & Optoelectronics, 2016, том 19
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Semicond. Physics Quantum Electronics & Optoelectronics, 2016, № 2
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dc.contributor.author	Manko, A.A.
dc.contributor.author	Svechnikov, G.S.
dc.date.accessioned	2017-06-14T16:43:35Z
dc.date.available	2017-06-14T16:43:35Z
dc.date.issued	2016
dc.identifier.citation	New method for estimating the refractive index of optical materials in spectrally selective elements / A.A. Manko, G.S. Svechnikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 2. — С. 169-172. — Бібліогр.: 6 назв. — англ.	uk_UA
dc.identifier.issn	1560-8034
dc.identifier.other	DOI: 10.15407/spqeo19.02.169
dc.identifier.other	PACS 02.70.Uu, 42.79.-e, 78.20.Ci, 78.35.+c
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/121556
dc.description.abstract	A numerical simulation of the scattering indicatrix in optical spectral-selective cylindrical form elements has been performed. As it follows from the results of the calculations, the shape of the scattering indicatrix of these elements is unambiguously determined by the refractive index of material from which they are made. Location of angular peaks in the indicatrix in combination with its shape allows to estimate the refractive index with sufficiently high degree of accuracy.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України	uk_UA
dc.relation.ispartof	Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title	New method for estimating the refractive index of optical materials in spectrally selective elements	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA