New possibility of retrospective EPR dosimetry

dc.contributor.author	Vorona, I.
dc.contributor.author	Ishchenko, S.
dc.contributor.author	Okulov, S.
dc.contributor.author	Petrenko, T.T.
dc.date.accessioned	2017-06-13T15:09:24Z
dc.date.available	2017-06-13T15:09:24Z
dc.date.issued	2000
dc.identifier.citation	New possibility of retrospective EPR dosimetry / I. Vorona, S. Ishchenko, S. Okulov, T.T. Petrenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 2. — С. 219-222. — Бібліогр.: 13 назв. — англ.	uk_UA
dc.identifier.issn	1560-8034
dc.identifier.other	PACS: 76.30.- v
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/121114
dc.description.abstract	Tooth enamel plates irradiated by different types of radiation were studied by electron paramagnetic resonance imaging with local gradient of magnetic field. The dependence of radiation defect distributions on an irradiation type was found. A new procedure of retrospective electron paramagnetic resonancedosimetry determining the irradiation type was proposed.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України	uk_UA
dc.relation.ispartof	Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title	New possibility of retrospective EPR dosimetry	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA