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dc.contributor.author |
Tkachenko, V.F. |
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dc.contributor.author |
Kryvonogov, S.I. |
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dc.contributor.author |
Budnikov, A.T. |
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dc.contributor.author |
Lukienko, O.A. |
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dc.contributor.author |
Vovk, E.A. |
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dc.date.accessioned |
2017-06-12T07:30:07Z |
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dc.date.available |
2017-06-12T07:30:07Z |
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dc.date.issued |
2014 |
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dc.identifier.citation |
Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method / V.F. Tkachenko, S.I. Kryvonogov, A.T. Budnikov, O.A. Lukienko, E.A. Vovk // Functional Materials. — 2014. — Т. 21, № 2. — С. 171-175. — Бібліогр.: 17 назв. — англ. |
uk_UA |
dc.identifier.issn |
1027-5495 |
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dc.identifier.other |
DOI: dx.doi.org/10.15407/fm21.02.171 |
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dc.identifier.uri |
http://dspace.nbuv.gov.ua/handle/123456789/120413 |
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dc.description.abstract |
The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire crystals with the surface orientation {0001} {11-20}. Analysis of the diffraction reflection curves made it possible to establish the structure and character of distortions in the DL. There was established the mean-square disorientation between the fragments, which allowed to characterize the defects structure of the surface-adjacent DL. |
uk_UA |
dc.language.iso |
en |
uk_UA |
dc.publisher |
НТК «Інститут монокристалів» НАН України |
uk_UA |
dc.relation.ispartof |
Functional Materials |
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dc.subject |
Characterization and properties |
uk_UA |
dc.title |
Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method |
uk_UA |
dc.type |
Article |
uk_UA |
dc.status |
published earlier |
uk_UA |
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