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Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method
Репозиторій DSpace/Manakin
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Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method
Тема:
Characterization and properties
Інший ID:
DOI: dx.doi.org/10.15407/fm21.02.171
Посилання:
Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method / V.F. Tkachenko, S.I. Kryvonogov, A.T. Budnikov, O.A. Lukienko, E.A. Vovk // Functional Materials. — 2014. — Т. 21, № 2. — С. 171-175. — Бібліогр.: 17 назв. — англ.
Дата:
2014
Переглядів:
712
Завантажень:
563
Анотація:
The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire crystals with the surface orientation {0001} {11-20}. Analysis of the diffraction reflection curves made it possible to establish the structure and character of distortions in the DL. There was established the mean-square disorientation between the fragments, which allowed to characterize the defects structure of the surface-adjacent DL.
