On problem of the rigorous diffraction quantitative description

Домашня сторінка
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Фізико-технічні та математичні науки
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Відділення фізики і астрономії
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Semiconductor Physics Quantum Electronics & Optoelectronics
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Semiconductor Physics Quantum Electronics & Optoelectronics, 1999, том 2
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Semicond. Physics Quantum Electronics & Optoelectronics, 1999, № 4
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dc.contributor.author	Anokhov, S.
dc.date.accessioned	2017-06-11T13:42:37Z
dc.date.available	2017-06-11T13:42:37Z
dc.date.issued	1999
dc.identifier.citation	On problem of the rigorous diffraction quantitative description / S. Anokhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 4. — С. 66-69. — Бібліогр.: 15 назв. — англ.	uk_UA
dc.identifier.issn	1560-8034
dc.identifier.other	PACS: 42.25.K
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/120244
dc.description.abstract	New data showing an inaccuracy of Kirchhoff's description for the diffraction of the limited aperture light beams are presented. A series of the known experimental facts, which did not have an unequivocal interpretation within the framework of this theory, gains a simple explanation with passage to conceptions of the rigorous diffraction theory. The difficulties hindering the wide application of this theory for solving practical problems are considered as well.	uk_UA
dc.description.sponsorship	The author is very grateful to Prof. A. Khizhiyak for fruitful discussions and for his constructive remarks.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України	uk_UA
dc.relation.ispartof	Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title	On problem of the rigorous diffraction quantitative description	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA