Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions

Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions

Ivanov, Z.G. ; Fogel, N.Ya. ; Yuzephovich, O.I. ; Stepantsov, E.A. ; Tzalenchuk, A.Ya.

Тема: Свеpхпpоводимость, в том числе высокотемпеpатуpная

Інший ID: PACS: 74.60.Jg, 74.60.Ec, 74.72.Bk

URI: http://dspace.nbuv.gov.ua/handle/123456789/119474

Посилання: Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ.

Підтримка: Discussions with R.I. Shekhter and L.Yu. Gorelik are gratefully acknowledged. The project utilized the Swedish Nanometer Laboratory and was supported by the Materials consortium on superconductivity.

Дата: 2004

Завантажень: 379

Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions

Анотація:

We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vortex motion determines a crossover in the temperature dependence of the critical current. The high entrance field of vortices in very narrow superconducting channels creates the possibility of carrying a critical current close to the depairing limit determined by the S–S–S nature of the small-angle grain boundary junction.

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