Показати простий запис статті

dc.contributor.author Freik, D.M.
dc.contributor.author Ruvinskii, M.A.
dc.contributor.author Ruvinskii, B.M.
dc.contributor.author Galushchak, M.A.
dc.date.accessioned 2017-06-05T14:46:59Z
dc.date.available 2017-06-05T14:46:59Z
dc.date.issued 2001
dc.identifier.citation Crystallochemistry of defects in lead telluride films / D.M. Freik, M.A. Ruvinskii, B.M. Ruvinskii, M.A. Galushchak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 1. — С. 5-8. — Бібліогр.: 13 назв. — англ. uk_UA
dc.identifier.issn 1560-8034
dc.identifier.other PACS 72.20.M, 73.40
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/119233
dc.description.abstract The crystallochemical model of vapor-phase epitaxy of the lead telluride films has been proposed with the supposition about the simultaneous formation of singly charged, doubly charged and electroneutral Frenkel defects in the cationic sublattice. It has been shown that in spite of the large concentration of partly compensated doubly charged defects the singly charged Frenkel pairs Pbi⁺ and VPb⁻ also play an essential role in change carrier concentration in PbTe films. The results of numerical calculation agree with the available experimental data of the dependence of charge carrier's concentration in films upon the partial pressure of tellurium vapor and the deposition's temperature in the hot-wall method. uk_UA
dc.language.iso en uk_UA
dc.publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України uk_UA
dc.relation.ispartof Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title Crystallochemistry of defects in lead telluride films uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


Файли у цій статті

Ця стаття з'являється у наступних колекціях

Показати простий запис статті

Пошук


Розширений пошук

Перегляд

Мій обліковий запис