Анотація:
The internal reflection of nanosized gold cluster films was studied using the
technique of polarization modulation of electromagnetic radiation in the Kretschmann
geometry. We measured the reflection coefficients Rs and Rp of s- and p-polarized
radiation, respectively, as well as their polarization difference ∆R = Rs − Rp, as function
of the light incidence angle in the 0.4÷1.6 µm wavelength range. A topological size
effect was found; it consists in dependence of the value and sign of curvature of the
polarization difference characteristics on the film surface properties. It is shown that the
sign of curvature of ∆R characteristics depends on the radiation wavelength λ and
indicates resonance interaction with a metal film of either p-polarized radiation only or
that of both polarizations. The spectral characteristic of the topological size effect in the
resonance interaction is obtained from the condition of isotropic reflection, ∆R = Rs − Rp
= 0, and its dependence on the radiation wavelength.