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dc.contributor.author |
Konoreva, O. |
|
dc.contributor.author |
Malyj, E. |
|
dc.contributor.author |
Mamykin, S. |
|
dc.contributor.author |
Petrenko, I. |
|
dc.contributor.author |
Pinkovska, M. |
|
dc.contributor.author |
Tartachnyk, V. |
|
dc.date.accessioned |
2017-05-30T06:02:12Z |
|
dc.date.available |
2017-05-30T06:02:12Z |
|
dc.date.issued |
2014 |
|
dc.identifier.citation |
Influence of complex defects on electrophysical properties
of GaP light emitting diodes / O. Konoreva, E. Malyj, S. Mamykin, I. Petrenko, M. Pinkovska, V. Tartachnyk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 2. — С. 184-187. — Бібліогр.: 9 назв. — англ. |
uk_UA |
dc.identifier.issn |
1560-8034 |
|
dc.identifier.other |
PACS 29.40.-n, 85.30.-z, 85.60.Dw |
|
dc.identifier.uri |
http://dspace.nbuv.gov.ua/handle/123456789/118369 |
|
dc.description.abstract |
In order to estimate the role of complex defects on GaP light emitting diodes
(LED) operation, luminescent and electrical characteristics of GaP LEDs irradiated with
reactor neutrons have been studied. It has been stated that nonradiative levels of radiation
defects affect electroluminescence quenching. From the analysis of the tunnel current,
the density of dislocations in the depleted part of the p–n junction was obtained. Neutron
induced disorder regions do not change the tunnel component of the direct current of red
diodes, increasing the dislocation density, because the carrier flow along the “tunnel
shunts” is blocked. |
uk_UA |
dc.language.iso |
en |
uk_UA |
dc.publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
uk_UA |
dc.relation.ispartof |
Semiconductor Physics Quantum Electronics & Optoelectronics |
|
dc.title |
Influence of complex defects on electrophysical properties of GaP light emitting diodes |
uk_UA |
dc.type |
Article |
uk_UA |
dc.status |
published earlier |
uk_UA |
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