Metrological support of satellite-borne UV-spectrometry using a backscattering technique

dc.contributor.author	Vashchenko, V.
dc.contributor.author	Patlashenko, Zh.
dc.contributor.author	Chernysh, E.
dc.date.accessioned	2017-05-28T18:33:12Z
dc.date.available	2017-05-28T18:33:12Z
dc.date.issued	2004
dc.identifier.citation	Metrological support of satellite-borne UV-spectrometry using a backscattering technique / V. Vashchenko, Zh. Patlashenko, E. Chernysh // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 105-107. — Бібліогр.: 10 назв. — англ.	uk_UA
dc.identifier.issn	1560-8034
dc.identifier.other	PACS: 07.60.Rd
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/118144
dc.description.abstract	Methods and physicotechnical facilities for examination, calibration and metrological testing of the main power spectral characteristics (total spectral sensitivity, scattered stray radiation, dynamic range) of the vehicle-borne ozone UV spectrometers in the spectral range 250-350 nm are considered.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України	uk_UA
dc.relation.ispartof	Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title	Metrological support of satellite-borne UV-spectrometry using a backscattering technique	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA