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Influence of elastic deformation on the residual ellipticity of polished optical materials

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dc.contributor.author Maslov, V.P.
dc.contributor.author Sarsembaeva, A.Z.
dc.contributor.author Sizov, F.F.
dc.date.accessioned 2017-05-28T16:35:57Z
dc.date.available 2017-05-28T16:35:57Z
dc.date.issued 2003
dc.identifier.citation Influence of elastic deformation on the residual ellipticity of polished optical materials / V.P. Maslov, A.Z. Sarsembaeva, F.F. Sizov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 514-516. — Бібліогр.: 7 назв. — англ. uk_UA
dc.identifier.issn 1560-8034
dc.identifier.other PACS: 42.86.+b, 78.20.-e
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/118078
dc.description.abstract The elastic deformation of thin mirrors is widely used in systems of adaptive optics, however, there are no data upon investigations of influence of elastic deformations on parameters of reflected polarised light in the literature. Using the method of ellipsometry, the influence of elastic deformation on the residual ellipticity of polished samples made of optical materials was studied. The results obtained during the researches have shown that the application of elastic deformations leads to essential changes of the minimum ellipticity tgp of polished samples, which testifies to the necessity to take into account this circumstance for devices of adaptive optics, input windows, cryostats and other optical parts working with the changing temperature. uk_UA
dc.language.iso en uk_UA
dc.publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України uk_UA
dc.relation.ispartof Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title Influence of elastic deformation on the residual ellipticity of polished optical materials uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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