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Singular optics methods for analysis of spatial structure of diffraction field of optical elements

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dc.contributor.author Budnyk, O.P.
dc.contributor.author Lymarenko, R.A.
dc.date.accessioned 2017-05-28T14:39:01Z
dc.date.available 2017-05-28T14:39:01Z
dc.date.issued 2003
dc.identifier.citation Singular optics methods for analysis of spatial structure of diffraction field of optical elements / O.P. Budnyk, R.A. Lymarenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 417-422. — Бібліогр.: 13 назв. — англ. uk_UA
dc.identifier.issn 1560-8034
dc.identifier.other PACS: 42.15.F, 42.25.F
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/118054
dc.description.abstract The paper is devoted to developing methods of analytical and experimental investigations of diffraction and interference phenomena used in test systems for optical elements. The theoretical analysis and experimental results illustrate the possibility of describing diffraction phenomena using the objects and methods that were developed in singular optics. It was shown that a system of dislocations in singular component of diffraction field represents its topology. The diffracted field has a system of hidden optical vortices that are smoothly transformed during deformation of an aperture depending on boundary flexion. The proposed experimental proof ground can be useful for the analysis of a wavefront structure. It is also considered the technique for more accurate evaluation of Ronchi test results. The mathematical background of the Ronchi test technique is developed. It describes sufficiently well the wavefront shape, grating plate parameters, image sensor characteristics, parameters of image acquisition and restoration. The fringe pattern distributions and their spatial spectrum are calculated. Both the results of computer simulation of Ronchi fringe pattern and experimental ones obtained using image sensor and the applied image enhancement algorithms are shown. uk_UA
dc.language.iso en uk_UA
dc.publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України uk_UA
dc.relation.ispartof Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title Singular optics methods for analysis of spatial structure of diffraction field of optical elements uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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