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Silicon carbide defects and luminescence centers in current heated 6H-SiC

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dc.contributor.author Lee, S.W.
dc.contributor.author Vlaskina, S.I.
dc.contributor.author Vlaskin, V.I.
dc.contributor.author Zaharchenko, I.V.
dc.contributor.author Gubanov, V.A.
dc.contributor.author Mishinova, G.N.
dc.contributor.author Svechnikov, G.S.
dc.contributor.author Rodionov, V.E.
dc.contributor.author Podlasov, S.A.
dc.date.accessioned 2017-05-26T12:18:31Z
dc.date.available 2017-05-26T12:18:31Z
dc.date.issued 2010
dc.identifier.citation Silicon carbide defects and luminescence centers in current heated 6H-SiC / S.W. Lee, S.I. Vlaskina, V.I. Vlaskin, I.V. Zaharchenko, V.A. Gubanov, G.N. Mishinova, G.S. Svechnikov, V.E. Rodionov, and S.A. Podlasov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 24-29. — Бібліогр.: 23 назв. — англ. uk_UA
dc.identifier.issn 1560-8034
dc.identifier.other PACS 71.55.Gs, 78.55.-m, Cr, 78.60.-b, 78.66.Hf
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/117702
dc.description.abstract At room temperature yellow photoluminescence with a broad peak of 2.13 eV is a well-known feature of boron-doped 6H-SiC. Usually yellow luminescence is regarded as recombination involving both the boron-related deep acceptor and donor level. But the nature of the deep level has not been clearly understood yet. We annealed 6H-SiC substrates by current in vacuum without boron injection at the temperature of 1350 and 1500 ºC. We received red and yellow luminescence in PL spectrum for the heated 6H-SiC. The luminescence was regarded as donor-acceptor pair recombination involving the deep aluminum acceptor related to the adjacent carbon vacancies and nitrogen donor or the formation of quantum well like regions of 3C-SiC in 6H-SiC matrix. uk_UA
dc.language.iso en uk_UA
dc.publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України uk_UA
dc.relation.ispartof Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title Silicon carbide defects and luminescence centers in current heated 6H-SiC uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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