Tkachenko, V.F.; Kryvonogov, S.I.; Budnikov, A.T.; Lukienko, O.A.; Vovk, E.A.
(Functional Materials, 2014)
The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire ...