Зміст

Kryuchenko Yu.V., Korbutyak D.V.
Light emission by point dipole located inside spherical (semiconductor) particle in the vicinity of a spherical metal particle

Karachevtseva L., Goltviansky Yu., Kolesnyk O., Lytvynenko O., Stronska O.
Wannier–Stark electro-optical effect and photonic modes in 2D macroporous silicon structures with SiO₂ nanocoatings

Fodchuk I.M., Gutsuliak I.I., Zaplitniy R.A., Balovsyak S.V., Yaremiy I.P., Bonchyk O.Yu., Savitskiy G.V., Syvorotka I.M., Lytvyn P.M.
Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions

Kopcansky P., Timko M., Mitrova Z., Zavisova V., Koneracka M., Tomasovicova N., Tomco L., Kovalchuk O.V., Bykov V.M., Kovalchuk T.M., Lad A.I.
Effect of magnetic nanoparticles with various geometrical shapes on morphology and dielectric properties of nanodispersions of nematic liquid crystal in polymer matrix

Studenyak I.P., Kranj?ec M., Buchuk R.Yu., Stephanovich V.O., Kokenyesi S.
Raman scattering studies of composites based on Cu₆PS₅X (X = I Br) superionic nanocrystals

Safriuk N.V., Stanchu G.V., Kuchuk A.V., Kladko V.P., Belyaev A.E., Machulin V.F.
X-ray diffraction investigation of GaN layers on Si(111) and Al₂O₃ (0001) substrates

Vlaskina S.I., Mishinova G.N., Vlaskin V.I., Rodionov V.E., Svechnikov G.S.
8H- 10H- 14H-SiC formation in 6H-3C silicon carbide phase transitions

Sheremet V.N.
Effect of microwave treatment on current flow mechanism in ohmic contacts to GaN

Kulish N.R., Kunets V.P., Narsingi K.Y., Manasreh M.O., Kunets Vas. P.
Radiation-resistant ultraviolet curable polyurethane films with CdSe-ZnS сore-shell nanocrystals

Belyaev A.E., Boltovets N.S., Zhilyaev Yu.V., Zhigunov V.S., Konakova R.V., Panteleev V.N., Sachenko A.V., Sheremet V.N.
Effect of microwave radiation on I-V curves and contact resistivity of ohmic contacts to n-GaN and n-AlN

Borovoy N., Gololobov Yu., Isaienko G., Salnik A.
On features of crystal structure of semiconductor-ferroelectric Ag₃AsS₃

Maslov V.P., Kachur N.V.
Use of radiation from PC screen for non-destructive controlling the internal strains in transparent parts

Rudenko T., Nazarov A., Kilchytska V., Flandre D., Popov V., Ilnitsky M., Lysenko V.
Revision of interface coupling in ultra-thin body silicon-on-insulator MOSFETs