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Properties and application of the unequal thickness two-component interference systems
Репозиторій DSpace/Manakin
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- Фізико-технічні та математичні науки
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- Відділення фізики і астрономії
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- Semiconductor Physics Quantum Electronics & Optoelectronics
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- Semiconductor Physics Quantum Electronics & Optoelectronics, 2000, том 3
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- Semicond. Physics Quantum Electronics & Optoelectronics, 2000, № 3
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Properties and application of the unequal thickness two-component interference systems
Інший ID:
PACS: 42.79.Fm,W
Посилання:
Properties and application of the unequal thickness two-component interference systems / I.V. Fekeshgazi, V.Yu. Pervak, Yu.A. Pervak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 3. — С. 371-378. — Бібліогр.: 20 назв. — англ.
Дата:
2000
Переглядів:
736
Завантажень:
314
Анотація:
The methods of synthesis and designing of the two-component unequal thickness multilayer interference systems as well as interconnection of their indices of layers are presented. A solution of the problem of suppressing high reflection zones at any harmonic frequency while maintaining high reflection at the operating frequency is proposed. The evolution of refractive zones at the inclined light incidence on the multilayer systems are studied. The results of the synthesis of antireflective coatings for some widely separated wavelengths are discussed. The application of results for the specific spectral characteristics and interference filters are proposed.
