Laser scanning microscopy of HTS films and devices (Review Article)

Laser scanning microscopy of HTS films and devices (Review Article)

Zhuravel, A.P. ; Sivakov, A.G. ; Turutanov, O.G. ; Omelyanchouk, A.N. ; Anlage, S.M. ; Lukashenko, A. ; Ustinov, A.V. ; Abraimov, D.

Тема: Experimental Methods and Applications

Інший ID: PACS: 68.37.–d, 74.25.Nf, 74.78.Bz, 85.25.–j

URI: http://dspace.nbuv.gov.ua/handle/123456789/120206

Посилання: Laser scanning microscopy of HTS films and devices (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ.

Підтримка: We acknowledge valuable contribution from Stephen Remillard (Agile Devices, USA). Yu. Koval (Erlangen University, Germany) is acknowledged for making high-quality samples by electron lithography. This work has been supported in part by the NSF/GOALI DMR-0201261, the program «Nanosystems, nanomaterials, and nanotechnology» of the National Academy of Sciences of Ukraine, and a DFG Grant «Vortex matter in mesoscopic superconductors».

Дата: 2006

Завантажень: 555

Laser scanning microscopy of HTS films and devices (Review Article)

Анотація:

The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved method of testing high–Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses in rf mode, probing the superconducting properties of HTS single crystals, development of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of resistivity in HTS materials is proven by LSM imaging.

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