Laser scanning microscopy of HTS films and devices (Review Article)

dc.contributor.author	Zhuravel, A.P.
dc.contributor.author	Sivakov, A.G.
dc.contributor.author	Turutanov, O.G.
dc.contributor.author	Omelyanchouk, A.N.
dc.contributor.author	Anlage, S.M.
dc.contributor.author	Lukashenko, A.
dc.contributor.author	Ustinov, A.V.
dc.contributor.author	Abraimov, D.
dc.date.accessioned	2017-06-11T12:44:24Z
dc.date.available	2017-06-11T12:44:24Z
dc.date.issued	2006
dc.identifier.citation	Laser scanning microscopy of HTS films and devices (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ.	uk_UA
dc.identifier.issn	0132-6414
dc.identifier.other	PACS: 68.37.–d, 74.25.Nf, 74.78.Bz, 85.25.–j
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/120206
dc.description.abstract	The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved method of testing high–Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses in rf mode, probing the superconducting properties of HTS single crystals, development of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of resistivity in HTS materials is proven by LSM imaging.	uk_UA
dc.description.sponsorship	We acknowledge valuable contribution from Stephen Remillard (Agile Devices, USA). Yu. Koval (Erlangen University, Germany) is acknowledged for making high-quality samples by electron lithography. This work has been supported in part by the NSF/GOALI DMR-0201261, the program «Nanosystems, nanomaterials, and nanotechnology» of the National Academy of Sciences of Ukraine, and a DFG Grant «Vortex matter in mesoscopic superconductors».	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України	uk_UA
dc.relation.ispartof	Физика низких температур
dc.subject	Experimental Methods and Applications	uk_UA
dc.title	Laser scanning microscopy of HTS films and devices (Review Article)	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA