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періодичних видань НАН України
періодичних видань НАН України
The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure
Репозиторій DSpace/Manakin
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The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure
Тема:
Characterization and properties
Інший ID:
DOI: dx.doi.org/10.15407/fm20.01.081
Посилання:
The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure / S.V. Bazdyreva, N.V. Fedchuk, S.V. Malykhin, A.T. Pugachov, M.V. Reshetnyak, E.N. Zubarev // Functional Materials. — 2013. — Т. 20, № 1. — С. 81-86. — Бібліогр.: 27 назв. — англ.
Дата:
2013
Переглядів:
844
Завантажень:
645
Анотація:
Method of quantitative estimates of the parameters of the icosahedral quasicrystals substructure, including specific phason defects, developed and successfully worked out using the experimental models of quasicrystalline Al₇₀Pd₂₁Re₉, Ti₄₁.₅Zr₄₁.₅Ni₁₇ and Al₆₄.₅Pd₂₁Mn₁₄.₅ with different preparation technology. The method is based on the analysis of the diffraction lines' width of complete X-ray diffraction pattern. The results are in a good agreement with the prehistory of the samples.
