The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure

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Фізико-технічні та математичні науки
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Відділення фізико-технічних проблем матеріалознавства
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Functional Materials
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Functional Materials, 2013, том 20
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Functional Materials, 2013, № 1
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dc.contributor.author	Bazdyreva, S.V.
dc.contributor.author	Fedchuk, N.V.
dc.contributor.author	Malykhin, S.V.
dc.contributor.author	Pugachov, A.T.
dc.contributor.author	Reshetnyak, M.V.
dc.contributor.author	Zubarev, E.N.
dc.date.accessioned	2017-06-10T10:51:31Z
dc.date.available	2017-06-10T10:51:31Z
dc.date.issued	2013
dc.identifier.citation	The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure / S.V. Bazdyreva, N.V. Fedchuk, S.V. Malykhin, A.T. Pugachov, M.V. Reshetnyak, E.N. Zubarev // Functional Materials. — 2013. — Т. 20, № 1. — С. 81-86. — Бібліогр.: 27 назв. — англ.	uk_UA
dc.identifier.issn	1027-5495
dc.identifier.other	DOI: dx.doi.org/10.15407/fm20.01.081
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/119902
dc.description.abstract	Method of quantitative estimates of the parameters of the icosahedral quasicrystals substructure, including specific phason defects, developed and successfully worked out using the experimental models of quasicrystalline Al₇₀Pd₂₁Re₉, Ti₄₁.₅Zr₄₁.₅Ni₁₇ and Al₆₄.₅Pd₂₁Mn₁₄.₅ with different preparation technology. The method is based on the analysis of the diffraction lines' width of complete X-ray diffraction pattern. The results are in a good agreement with the prehistory of the samples.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	НТК «Інститут монокристалів» НАН України	uk_UA
dc.relation.ispartof	Functional Materials
dc.subject	Characterization and properties	uk_UA
dc.title	The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA