Анотація:
The Si-SiO₂ interface in oxidized macroporous silicon structures with surface
CdS and ZnO nanocrystals was investigated using the methods of electroreflectance and
photoconductivity. The Franz-Keldysh effect, built-in electric field and surface
quantization of charge carriers in the Si-SiO₂ region were revealed. The splitting of
photoconductivity peaks was detected in the area of indirect band-to-band transition due
to quantization of charge carriers in the surface silicon region, too. The latter data
correlate with the results of the electroreflectance spectra measurements in the area of
direct interband transition of oxidized macroporous silicon structures with surface CdS
and ZnO nanocrystals.