Перегляд за автором "Yanchuk, I.B."

Сортувати за: Порядок: Результатів:

  • Brichka, S.Ya.; Yanchuk, I.B.; Konchits, A.A.; Kolesnik, S.P.; Yefanov, A.V.; Brichka, A.V.; Kartel, N.T. (Хімія, фізика та технологія поверхні, 2011)
    Cerium (IV) oxide (ceria) nanoparticles, 6–10 nm in size, supported on carbon nanotubes (CNTs) were prepared by a chemical reaction between Ce(NO3)3 and NaOH. The effective processing parameters of ceria particles size ...
  • Yukhymchuk, V.O.; Kostyukevych, S.A.; Dzhagan, V.M.; Milekhin, A.G.; Rodyakina, E.E.; Yanchuk, I.B.; Shepeliavy, P.Ye.; Valakh, M.Ya.; Kostyukevych, K.V.; Lysiuk, V.O.; Tverdokhlib, I.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2012)
    Preparation and study of laterally ordered and disordered arrays of Au nanoislands as SERS substrates are reported. Developed technology allows obtaining SERS substrates with long-term stability (up to six months), efficient ...
  • Perekrestov, V.I.; Kosminskaya, Yu.A.; Yanchuk, I.B. (Functional Materials, 2004)
    The mechanisms of structure formation of Ti-C system layers have been studied. The layers have been obtained at nonequilibrium process of transition of vapors with necessary component ratio into condensed state. Various ...
  • Konchits, A.A.; Shanina, B.D.; Valakh, M.Ya.; Yanchuk, I.B.; Yukhymchuk, V.O.; Yefanov, A.V.; Krasnovyd, S.V.; Skoryk, M.A. (Functional Materials, 2014)
    The correlation between morphology, local structure and magnetic properties of the different origin shungite material with nanocarbon content 25-40 wt. % was studied by SEM, EPR, and Raman scattering methods. It was ...
  • Onoprienko, A.A.; Yanchuk, I.B. (Functional Materials, 2006)
    Electric resistivity and microstructure of silicon-doped (5 to 38 at. % Si) amorphous carbon (α-C) films deposited by de magnetron sputtering in argon plasma of composed (graphite + single crystalline silicon) target has ...
  • Babichuk, I.S.; Yukhymchuk, V.O.; Dzhagan, V.M.; Valakh, M.Ya.; Leon, M.; Yanchuk, I.B.; Gule, E.G.; Greshchuk, O.M. (Functional Materials, 2013)
    The structure of Cu₂ZnSnS₄ films was investigated by Raman spectroscopy, scanning electron microscopy, energy dispersive X-ray spectrometry, optical reflectance and photoluminescence. The films were formed by thermal ...