Перегляд за автором "Reshetnyk, O.V."

Результати 1-3 з 3

Double- and triple-crystal X-ray diffractometry of microdefects in silicon

Molodkin, V.B.; Olikhovskii, S.I.; Kyslovskyy, Ye.M.; Len, E.G.; Reshetnyk, O.V.; Vladimirova, T.P.; V.V. Lizunov, V.V.; Lizunova, S.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2010)

The generalized dynamical theory of X-ray scattering by real single crystals allows to self-consistently describe intensities of coherent and diffuse scattering measured by double- and triple-crystal diffractometers (DCD ...
Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals

Molodkin, V.B.; Olikhovskii, S.I.; Len, E.G.; Kyslovskyy, Ye.M.; Reshetnyk, O.V.; Vladimirova, T.P.; Sheludchenko, B.V.; Skakunova, E.S.; Lizunov, V.V.; Kochelab, E.V.; Fodchuk, I.M.; Klad’ko, V.P. (Металлофизика и новейшие технологии, 2016)

A short review of basic principles and limitations in obtaining the analytical expressions for the coherent and diffuse scattering intensities measured by the triple-crystal diffractometer (TCD) are presented. Explicit ...
Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of Strains and Defects in Ion-Implanted Garnet Films

Molodkin, V.B.; Olikhovskii, S.I.; Skakunova, E.S.; Len, E.G.; Kislovskii, E.N.; Reshetnyk, O.V.; Vladimirova, T.P.; Lizunov, V.V.; Skapa, L.N.; Lizunova, S.V.; Fuzik, E.V.; Tolmachev, N.G.; Ostafiychuk, B.K.; Pylypiv, V.M.; Garpul’, O.Z. (Металлофизика и новейшие технологии, 2015)

Numerical simulation of the reciprocal-space maps for ion-implanted single-crystal yttrium—iron garnet films on gadolinium—gallium garnet substrates is carried out and based on the theoretical model of the triple-axes ...

Результати 1-3 з 3

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Перегляд за автором "Reshetnyk, O.V."

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Перегляд за автором "Reshetnyk, O.V."

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