Перегляд за автором "Devizenko, A.Yu."

Сортувати за: Порядок: Результатів:

  • Pershyn, Yu.P.; Devizenko, I.Yu.; Chumak, V.S.; Devizenko, A.Yu.; Kondratenko, V.V. (Functional Materials, 2018)
    X-ray reflectometry in the hard X-ray region (λ = 0.154 nm) was used to investigate the barrier properties of carbon layers 0.2-1.3 nm thick in Sc/Si multilayer X-ray mirrors (MXMs) deposited by DC magnetron sputtering. ...
  • Penkov, A.V.; Voronov, D.L.; Devizenko, A.Yu.; Ponomarenko, A.G.; Zubarev, E.N. (Functional Materials, 2005)
    X-ray photoelectron spectroscopy, transmission electron microscopy, and and low-angle X-ray diffraction were used to investigate the diffusion intermixing in multilayer periodic Mo/Si coatings during manufacturing and ...
  • Pershyn, Y.P.; Chumak, V.S.; Shypkova, I.G.; Mamon, V.V.; Devizenko, A.Yu.; Kondratenko, V.V.; Reshetnyak, M.V.; Zubarev, E.N. (Вопросы атомной науки и техники, 2018)
    WC/Si multilayer X-ray mirrors (MXMs) with nominal layers thicknesses of 0.2…30.3 nm (periods: 0.7…38.9 nm) were deposited by direct current magnetron sputtering and studied by X-ray diffraction and cross-sectional ...
  • Bugayev, Ye.A.; Devizenko, A.Yu.; Zubarev, E.N.; Kondratenko, V.V. (Functional Materials, 2007)
    The formation features of the Co/C multilayer with ≈2.3 nm period have been studied with aim to form a Schwarzschild objective on a "carbon window" for medical and biological investigations. A sequence of multilayer ...
  • Devizenko, A.Yu.; Kopylets, I.A.; Kondratenko, V.V.; Pershyn, Y.P.; Devizenko, I.Y.; Zubarev, E.N.; Savitskiy, B.A. (Functional Materials, 2018)
    The structure, construction and mechanical stresses of the TaSi₂/Si multilayer manufactured by magnetron sputtering on the heated substrates were studied in the initial state and after thermal annealing. Deposition of ...