Перегляд за автором "Bugayev, Ye.A."

Сортувати за: Порядок: Результатів:

  • Formation and evolution of intermixing zones in C/Si multilayer under heating 
    Zhuravel, I.A.; Bugayev, Ye.A.; Penkov, A.V.; Zubarev, E.N.; Sevryukova, V.A.; Kondratenko, V.V. (Functional Materials, 2014)
    Formation of intermixing zones, their structure and phase composition in C/Si multilayers in as-deposited state and after annealing are studied. During deposition intermixing zones of ∼ 0.6 m thick are formed at both ...
  • Initial stages of diffusion and phase formation in Sc/Si layered systems 
    Voronov, D.L.; Zubarev, E.N.; Kondratenko, V.V.; Pershun, Yu.P.; Sevryukova, V.A.; Bugayev, Ye.A. (Functional Materials, 2008)
    Kinetics of phase formation Sc/Si multilayers and Si/Sc/Si three-layers within the temperature range of 130-400°C has been studied by cross-sectional transmission electron microscopy and small-angle X-ray reflectometry. ...
  • Nanoscale Co/C multilayers for "carbon window" Schwarzchild objective 
    Bugayev, Ye.A.; Devizenko, A.Yu.; Zubarev, E.N.; Kondratenko, V.V. (Functional Materials, 2007)
    The formation features of the Co/C multilayer with ≈2.3 nm period have been studied with aim to form a Schwarzschild objective on a "carbon window" for medical and biological investigations. A sequence of multilayer ...
  • Structural transformation in C/Si multilayer after annealing 
    Zhuravel, I.O.; Bugayev, Ye.A.; Konotopsky, L.E.; Zubarev, E.M.; Sevryukova, V.A.; Kondratenko, V.V. (Физическая инженерия поверхности, 2012)
    Amorphous C/Si multilayers were prepared by DC magnetron sputtering technique and investigated by transmission electron microscopy and low-angle x-ray diffraction methods after annealing at 650 and 950 °C. The amorphous ...