Peculiarities of the bunch shape monitor operation for high-intensity electron beams

Abstract

The simulation results of the Bunch Shape Monitor operation using coherent transformation of a time structure of an analyzed high-intensity electron beam into a spatial one of low-energy electrons emitted from a wire target will be presented. The electromagnetic field of an analyzed bunch disturbs the trajectories of secondary electrons, thus resulting in a degradation of phase resolution and in errors of phase position reading. Moreover there is a perturbation of the target potential due to the current compensating emission of the secondary electrons. The accuracy analysis has been carried out. The confident result to achieve the phase resolution less then one degree was obtained.