Integrated tuning of dielectric elements of accelerating structures

Abstract

The method based on a longitudinal waveguide dielectric resonance for tuning dielectric elements of slow-wave structure cells is reported. The cells with dielectric disks are tuned by compensating the permittivity spread and technological tolerances through the selection of the dielectric disk width. The method provides tuning of disks in the cells to accuracy no worse than 0.01 MHz for the general working frequency of the structure. This method is applicable for determining integrated characteristics of dielectric elements (effective permittivities) in microwave devices that can be used, for example, for the development of exit windows for high power microwave flows.