Karasyov, S.P.; Maryokhin, S.V.; Tenishev, A.Eh.; Uvarov, V.L.; Fursov, G.L.; Shevchenko, V.A.; Shlyakhov, I.N.; Tsvetkov, I.I.
(Вопросы атомной науки и техники, 1999)
One of the most actual problems of the metrology is obtaining of information about several parameters measured with the help of one sensor. With the reference to the metrology of the electron radiation on the industrial ...