The influence of thermal fluctuations on Coulomb blockade edge in small Josephson junctions with linear growing of voltage

dc.contributor.author	Askerzade, I.N.
dc.date.accessioned	2021-02-03T08:35:41Z
dc.date.available	2021-02-03T08:35:41Z
dc.date.issued	2018
dc.identifier.citation	The influence of thermal fluctuations on Coulomb blockade edge in small Josephson junctions with linear growing of voltage / I.N. Askerzade // Физика низких температур. — 2018. — Т. 44, № 3. — С. 278-280. — Бібліогр.: 17 назв. — англ.	uk_UA
dc.identifier.issn	0132-6414
dc.identifier.other	PACS: 73.23.Hk, 74.81.Fa
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/175973
dc.description.abstract	In this study we carried out the analysis of the thermal fluctuations on Coulomb blockade edge in small Josephson junctions with linear growing of voltage. It was shown that, charge fluctuation is determined by the energy ratio-parameter of small size Josephson junction, temperature and growing rate of voltage.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України	uk_UA
dc.relation.ispartof	Физика низких температур
dc.subject	Сверхпроводимость и низкотемпературная микроэлектроника	uk_UA
dc.title	The influence of thermal fluctuations on Coulomb blockade edge in small Josephson junctions with linear growing of voltage	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA