Zabudsky, V.; Golenkov, O.; Rikhalsky, O.; Reva, V.; Korinets, S.; Dukhnin, S.; Mytiai, R.
(Технология и конструирование в электронной аппаратуре, 2019)
This article describes the developed equipment that allows measuring the photoelectrical parameters of multielement photodetectors, specifically various formats of EMCCD (electron multiplying charge-coupled device) chips. ...