Keijsers, R.J.P.; Voets, J.; Shklyarevskii, O.I.; van Kempen, H.
(Физика низких температур, 1998)
The tunnel resistance of highly stable, mechanically controlled break junctions of Al, Au, Cu, Pb, Ni, Pt, and Pt-Ir, have been recorded as a function of the electrode spacing over 6-7 decades. Clear deviations from the ...