Перегляд Functional Materials, 2007, том 14 за автором "Lukienko, O.A."

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Structure perfection of bulk and near-surface layers in sapphire single crystals

Tkachenko, V.F.; Puzikov, V.M.; Dan`ko, A.Ya.; Budnikov, A.T.; Lukienko, O.A. (Functional Materials, 2007)

Triple-crystal X-ray diffractometry has been used to study the structure perfection in bulk and surface layer of basal-oriented sapphire single crystals grown using horizontal directional crystallization (HDC) in reducing ...
Study of nature of some defects visible in polarized light in sapphire signle crystals

Tkachenko, V.F.; Dan`ko, A.Ya.; Puzikov, V.M.; Budnikov, A.T.; Lukienko, O.A.; Sidelnikova, N.S.; Adonkin, G.T. (Functional Materials, 2007)

Using the precision technique of triple-crystal X-ray diffractometry, the structure of defect parts has been studied in large-size sapphire crystals grown by the horizontal directed crystallization in reducing gas media. ...

Результати 1-2 з 2

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